Naghmeh Karimi

Publications

• Signal Rise-Fall Time Based Fingerprinting in CAN Networks 2026 Proceedings of the IEEE International Conference on Communications (ICC 2026) · pp. 6 Hasin Reefat, Mohammad Ebrahimabadi, Mohamed F Younis, Naghmeh Karimi
• Assessment of Security Risks and Defenses in Chiplet 2026 VLSI Test Symposium (VTS) · IEEE · pp. 1-11 · Accepted Hasin Ishraq Reefat, Hossein Pourmehrani, Junie UM, Sylvain Guilley, N. Karimi
• ROCKET: Runtime Operating-Condition Aware KEy Refreshing Technique for Resisting Side-Channel Analysis Attacks 2026 VLSI Test Symposium (VTS) · IEEE · pp. 1-7 · Accepted H. Ishraq Reefat, H. Pourmehrani, J.-L. Danger, Sylvain Guilley, Naghmeh Karimi
• PHANTOM: Power Hammering Attack and Countermeasure on Multi-Tenant ReRAM Compute-in-Memory Accelerators 2026 IEEE TRANSACTIONS ON INFORMATION FORENSICS AND SECURITY · 21 · pp. 1606-1621 AR Bommana, R Bishnoi, Naghmeh Karimi, F Firouzi, K Chakrabarty
• Adversarial Machine Learning: From Attack Surface to Defence Mechanism 2026 Smart and Connected Health: AI, IoT, and Trustworthy Technologies · Springer Nature Switzerland · pp. 621-711 Hossein Pourmehrani, Naghmeh Karimi, Farshad Firouzi
• Glitch Propagation Through Flip-Flops Endangers Masking Schemes: Why Time Separation Is Required 2026 IEEE Design Automation & Test in Europe (DATE) · Accepted H. I. Reefat, M. Ebrahimabadi, S. Takarabt, S. Guilley, N. Karimi
• HEED: A Highly Efficient Electromagnetic Fault Detection Scheme 2026 IEEE Design Automation & Test in Europe (DATE) · Accepted R. Nabhan, M. Ebrahimabadi, J.-L. Danger, J.-M. Dutertre, S. Guilley, N. Karimi, R. Viera, I. Zaarour
• TARN: Trust Aware Routing To Enhance Security In 3D Network-on-Chips 2025 IEEE Design Automation & Test in Europe (DATE) · pp. 6 Hasin I Reefat, A. Aversa, I. Savidis, N. Karimi
• FAMOUS: Fault Attack Mitigation via Exploiting Invariances in Deep Neural Networks 2025 2025 IEEE International Test Conference (ITC) · IEEE · pp. 478-481 Javad Bahrami, Parsa Nooralinejad, Hamed Pirsiavash, Naghmeh Karimi
• Avoiding Malicious Nodes of a 3-D NoC with Security-Aware Priority-Based Routing 2025 Alec Aversa, H. I. Reefat, Naghmeh Karimi, Ioannis Savidis
• CBM-TI: Code-Based Masking against Glitches by Hybridization with Threshold Implementation 2025 2025 IEEE 43rd VLSI Test Symposium (VTS) · IEEE · pp. 1-11 Hasin Ishraq Reefat, Hossein Pourmehrani, Wei Cheng, Claude Carlet, Abderrahman Daif, Cédric Tavernier, Sylvain Guilley, Naghmeh Karimi
• TIGER: TrIaGing KEy Refreshing Frequency via Digital Sensors 2025 International Conference on Security and Cryptography · pp. 372-380 M. T. H Anik, H. I Reefat, M. Ebrahimabadi, J. Bahrami, H. Pourmehrani, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi
• BISSEL: Built-In Self Security via Embedded Sensors for Reproducible Side-Channel Leakage Assessment 2025 IEEE European Test Symp. (ETS) Md Toufi Hasan Anik, H. Ishraq Reefat, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi
• Multi- Sensor Data Fusion for Enhanced Detection of Laser Fault Injection Attacks in Cryptographic Hardware: Practical Results 2025 IEEE Design Automation & Test in Europe (DATE) M. Ebrahimabadi, R. Viera, S. Guilley, J.-L. Danger, J.-M. Dutertre, N. Karimi
• SUMIT: Secure Unicast and Multicast Communication in Internet of Mobile Things 2024 The IEEE Global Communications Conference (GLOBECOM 2024) · pp. 6 Hasin I Reefat, Mohammad Ebrahimabadi, Mohamed F Younis, Mona Alkanhal, Karimi Naghmeh
• PETIT: PUF-enabled Trust Evaluation Framework for IoT Networks 2024 Computer Networks · 254 · pp. 110772 Suhee Sanjana Mehjabin, Mohamed F Younis, Ali Tekeoglu, Mohammad Ebrahimabadi, Tamim Sookoor, Karimi Naghmeh
• Robust and Lightweight Challenge Obfuscation Mechanism for Anti-Modeling Protection of Arbiter-PUFs 2024 Journal of Hardware and Systems Security · pp. 17 Mohammad Ebrahimabadi, Mohamed F Younis, Suhee Sanjana Mehjabin, Ali Tekeoglu, Tamim Sookoor, Karimi Naghmeh
• Attacking Multi-Tenant FPGAs Without Manual Placement and Routing 2024 IEEE Computer Society Annual Symp. on VLSI (ISVLSI) Md Toufi Hasan Anik, H. Ishraq Reefat, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi
• FAT-RABBIT: Fault-Aware Training towards Robustness Against Bit-flip Based Attacks in Deep Neural Networks 2024 International Test Conf. (ITC) H. Pourmehrani, J. Bahrami, P. Nooralinejad, H Pirsiavash, Karimi Naghmeh
• DELFINES: DETECTING LASER FAULT INJECTION ATTACKS VIA DIGITAL SENSORS 2024 IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (TCAD) M. Ebrahimabadi, S. Mehjabin, R. Viera, S. Guilley, J.-L. Danger, J.-M. Dutertre, Karimi Naghmeh
• Multi-modal Pre-silicon Evaluation of Hardware Masking Styles 2024 Springer Journal of Electronic Testing (JETTA) · pp. 18 M.T.H Anik, W. Cheng, J.-L. Danger, S. Guilley, N. Karimi
• On the Resiliency of Protected Masked S-Boxes against Template Attack in the Presence of Temperature and Aging Misalignments 2024 IEEE Trans. on VLSI (TVLSI) M.T.H. Anik, J.-L. Danger, S. Guilley, N. Karimi
• The 28th IEEE European Test Symposium 2024 IEEE Design and Test Journal
• Impact of Process Mismatch and Device Aging on SR-Latch Based True Random Number Generators 2024 Springer International Workshop on Constructive Side-Channel Analysis and Secure Design (COSADE) J. Bahrami, M. Ebrahimabadi, S. Guilley, J.-L. Danger, Karimi Naghmeh
• Securing ISW Masking Scheme Against Glitches 2024 IEEE Design, Automation and Test in Europe Conference (DATE) Sofiane Takarabt, M. Ebrahimabadi, J. Bahrami, S. Guilley, Karimi Naghmeh
• Aging-Induced Failure Prognosis via Digital Sensors 2023 Great Lakes Symp. on VLSI (GLSVLSI) Md Toufi Hasan Anik, H. Ishraq Reefat, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi
• Challenges in Generating True Random Numbers Considering the Variety of Corners, Aging, and Intentional Attacks 2023 Int’l Conf. on IC Design and Technology (ICICDT) J. Bahrami, J.-L. Danger, M. Ebrahimabadi, S. Guilley, Karimi Naghmeh
• Evaluation of Entity Trustworthiness Based on Public and Private Data 2023 Int’l Conf. on Trust Management (IFIPTM) M. L. Sel, H. Ishraq Reefat, Naghmeh Karimi, K. Mersinas
• Security Order of Gate Level Masking Schemes 2023 IEEE Hardware-Oriented Security and Trust Symp. (HOST) Sofiane Takarabt, J. Bahrami, M. Ebrahimabadi, S. Guilley, Karimi Naghmeh
• Security Verification & Testing for SR-Latch TRNGs 2023 VLSI Test Symp. (VTS) J. Bahrami, M. Ebrahimabadi, J.-L. Danger, S. Guilley, Karimi Naghmeh
• Testing and Reliability Enhancement of Security Primitives: Methodology and Experimental Validation 2023 Microelectronics Reliability Journal M. H. T. Anik, J.-L. Danger, O. Diankha, M. Ebrahimabadi, C. Frisch, S. Guilley, N. Karimi, M. Pehl, S. Takarabt, S. Takarabt
• Collusion-resistant PUF-based Distributed Device Authentication Protocol for Internet of Things 2022 The IEEE Global Communications Conference (GLOBECOM 2022) · pp. 6 Wassila Lalouani, Mohamed F Younis, Mohammad Ebrahimabadi, Karimi Naghmeh
• SWeeT: Security Protocol for Wearables Embedded Devices' Data Transmission 2022 The IEEE International Conference on E-health Networking, Application & Services (Healthcom 2022) · pp. 6 Mohamed F Younis, Mohammad Ebrahimabadi, Wassila Lalouani, Karimi Naghmeh, Abdulaziz Alshaeri
• Countering Modeling Attacks in PUF-based IoT Security Solutions 2022 ACM Journal on Emerging Technologies in Computing Systems · 18 (3) · pp. 1–28 Wassila Lalouani, Mohamed F Younis, Mohammad Ebrahimabadi, Karimi Naghmeh
• A PUF-Based Modeling-Attack Resilient Authentication Protocol for IoT Devices 2022 IEEE Internet of Things Journal · 9 (5) · pp. 3684 – 3703 Mohammad Ebrahimabadi, Mohamed F Younis, Karimi Naghmeh
• An Attack Resilient PUF-based Authentication Mechanism for Distributed Systems 2022 The VLSI Design Conference (VLSID 2022) · pp. 6 Mohammad Ebrahimabadi, Mohamed F Younis, Wassila Lalouani, Karimi Naghmeh
• Detecting Laser Fault Injection Attacks via Time-to-Digital Converter Sensors 2022 Hardware-Oriented Security and Trust Symp. (HOST) M. Ebrahimabadi, S. Mehjabin, R. Viera, S. Guilley, J.-L. Danger, J.-M. Dutertre, Karimi Naghmeh
• Does Aging Matter? The Curious Case of Fault Sensitivity Analysis 2022 IEEE Int'l Symp. on Quality Electronic Design (ISQED) M. Ebrahimabadi, B. Fadaeinia, A Moradi, Karimi Naghmeh
• On the Practicality of Relying on Simulations in Different Abstraction Levels for Pre-Silicon Side-Channel Analysis 2022 Springer SECRYPT J. Bahrami, M. Ebrahimabadi, S. Takarabt, J.-L. Danger, S. Guilley, Karimi Naghmeh
• On the Reliability of Conventional and Quantum Neural Network Hardware 2022 VLSI Test Symp. M. Sadi, Y. He, Y. Li, M. Alam, S. Kundu, S. Ghosh, J. Bahrami, Karimi Naghmeh
• Leakage Power Analysis in Different S-Box Masking Protection Schemes 2022 IEEE Design Automation & Test in Europe (DATE) J. Bahrami, M. Ebrahimabadi, J.-L. Danger, S. Guilley, Karimi Naghmeh
• Countering PUF Modeling Attacks through Adversarial Machine Learning 2021 IEEE Computer Society Annual Symp. on VLSI (ISVLSI) · pp. 6 Mohammad Ebrahimabadi, Wassila Lalouani,, Mohamed F Younis, Karimi Naghmeh
• Enhancing the Resiliency of Multi-Bit Parallel Arbiter-PUF and its Derivatives against Power Attacks 2021 COSADE: Constructive Side-Channel Analysis and Secure Design Trevor Kroeger, Wei Cheng, S. Guilley, J.-L. Danger, Karimi Naghmeh
• Learning Assisted Side Channel Delay Test for Detection of Recycled ICs 2021 Proceedings of the 26th Asia and South Pacific Design Automation Conference · Association for Computing Machinery · pp. 455–462 Ashkan Vakil, Farzad Niknia, Ali Mirzaeian, Avesta Sasan, Naghmeh Karimi
• Making Obfuscated PUFs Secure Against Power Side-Channel Based Modeling Attacks 2021 Design, Test, and Automation in Europe (DATE) Trevor Kroeger, Wei Cheng, Sylvain Guilley, Jean-Luc Danger, Naghmeh Karimi
• Two Sides of the Same Coin: Boons and Banes of Machine Learning in Hardware Security 2021 IEEE Journal on Emerging and Selected Topics in Circuits and Systems (JETCAS) W. Liu, C. -H Chang, J. M Fung, Mohammad Ebrahimabadi, Naghmeh Karimi, X, Meng, K. Basu
• A Novel Modeling-Attack Resilient Arbiter-PUF Design 2021 The IEEE International Conference on VLSI Design & Embedded Systems (VLSID 2021) · pp. 6 Mohammad Ebrahimabadi, Mohamed F Younis, Wassila Lalouani, Karimi Naghmeh
• Smart Grid Cyber Attack Protection through Hardware Fingerprinting 2021 Proceedings of the IEEE Communications Conference (ICC 2021) · pp. 6 Mohammad Ebrahimabadi, Mohamed F Younis, Karimi Naghmeh
• On the Impact of Aging on Power Analysis Attacks Targeting Power-Equalized Cryptographic Circuits 2021 2021 26th Asia and South Pacific Design Automation Conference (ASP-DAC) · pp. 414-420 Md Toufiq Hasan Anik, Bijan Fadaeinia, Amir Moradi, Naghmeh Karimi
• Using Digital Sensors to Leverage Chips' Security 2020 2020 IEEE Physical Assurance and Inspection of Electronics (PAINE) · pp. 1-6 Mohammad Ebrahimabadi, Md T.H Anik, J. -L Danger, S. Guilley, Naghmeh Karimi
• On-Chip Voltage and Temperature Digital Sensor for Security, Reliability, and Portability 2020 2020 IEEE 38th International Conference on Computer Design (ICCD) · pp. 506-509 M. T. H Anik, M. Ebrahimabadi, Hamed Pirsiavash, J. -L Danger, S. Guilley, Naghmeh Karimi
• PUF Enrollment and Life Cycle Management: Solutions and Perspectives for the Test Community 2020 2020 IEEE European Test Symposium (ETS) · pp. 1-10 A. A Pour, V. Beroulle, B. Cambou, J. Danger, G. Di Natale, D. Hely, S. Guilley, Naghmeh Karim
• DFSSD: Deep Faults and Shallow State Duality, A Provably Strong Obfuscation Solution for Circuits with Restricted Access to Scan Chain 2020 2020 IEEE 38th VLSI Test Symposium (VTS) · pp. 1-6 S. Roshanisefat, H. M Kamali, K. Zamiri Azar, S. M. Pudukotai Dinakarrao, Naghmeh Karimi, H. Homayoun, A. Sasan
• LASCA: Learning Assisted Side Channel Delay Analysis for Hardware Trojan Detection 2020 2020 21st International Symposium on Quality Electronic Design (ISQED) · pp. 40-45 A. Vakil, F. Behnia, A. Mirzaeian, H. Homayoun, Naghmeh Karimi, A. Sasan
• Cross Attacks on Arbiter-PUFs through Their Power Side-Channel 2020 International Test Conf. (ITC) · pp. 1-5 Trevor Kroeger, Wei Cheng, Sylvain Guilley, Jean-Luc Danger, Naghmeh Karimi
• Failure and Attack Detection by Digital Sensors 2020 European Test Symp. (ETS) · pp. 1-2 Md Toufiq Hasan Anik, Rachit Saini, Jean-Luc Danger, Sylvain Guilley, naghmeh Karimi
• On the Effect of Aging on Digital Sensors 2020 VLSI Design. Conf. · pp. 1-6 Md Toufiq Hasan Anik, Sylvain Guilley, Jean-Luc Danger, Naghmeh Karimi
• Implementation-based design fingerprinting for robust IC fraud detection 2019 Journal of Hardware and Systems Security · 3 (4) · pp. 426–439 James Shey, Karimi Naghmeh, Chintan Patel, Ryan W Robucci
• Real-Time Prediction for IC Aging Based on Machine Learning 2019 IEEE Transactions on Instrumentation and Measurement Ke Huang, Xinqiao Zhang, Naghmeh Karimi
• Exploring the Effect of Device Aging on Static Power Analysis Attacks 2019 Conference on Cryptographic Hardware and Embedded Systems (CHES) Naghmeh Karimi, Amir Moradi, Thorben Moos
• Countering IP Security threats in Supply chain 2019 VLSI Test Symp. (VTS) · pp. 1-9 Hassan Salmani, Tamzidul Hoque, Swarup Bhunia, Muhammad Yasin, Jeyavijayan J. V. Rajendran, Naghmeh Karimi
• Design-Based Fingerprinting Using Side-Channel Power Analysis for Protection Against IC Piracy 2018 ISVLSI Conference · pp. 614-619 James Shey, Naghmeh Karimi, Ryan Robucci, Chintan Patel
• Device Aging: A Reliability and Security Concern 2018 European Test Symp. (ETS) · pp. 1-10 Daniel Kraak, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Francky r Catthoo, Abhijit Chatterjee, Adit D. Singh, Hans-Joachim Wunderlich, Naghmeh Karimi
• Impact of Aging on the Reliability of Delay PUFs 2018 Journal of Electronic Testing, Theory and applications (JETTA) · 34 (5) · pp. 571-586 Naghmeh Karimi, Jean-Luc Danger, Sylvain Guilley
• On the Effect of Aging in Detecting Hardware Trojan Horses with Template Analysis 2018 International Online Test Symp. · pp. 281-286 Naghmeh Karimi, Jean-Luc Danger, Sylvain Guilley
• Impact of Aging on Template Attacks 2018 ACM Great Lakes Symp. on VLSI (GlSVLSI) · pp. 455-458 Naghmeh Karimi, Sylvain Guilley, Jean-Luc Danger
• Impact of the Switching Activity on the Aging of Delay- PUFs 2017 European Test Symp. (ETS) Naghmeh Karimi, Jean-Luc Danger, Sylvain Guilley
• Testing and Reliability Enhancement of Security Primitives IEEE Int'l Symp. on Defect and Fault Tolerance of VLSI Systems (DFTS) M. H. T. Anik, J.-L. Danger, O. Diankha, M. Ebrahimabadi, C. Frisch, S. Guilley, Karimi Naghmeh, M. Pehl, S. Takarabt